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Magazine Name : Ieee Design And Test Of Computers

Year : 1997 Volume number : 13 Issue: 03

Microprocessor Architectuer Design With Atlas. (Article)
Subject:
Author: Danko Basch      Mario Zogar     
page:      104 - 112
A Bist And Boundary-Scan Economic Framework. (Article)
Subject:
Author: Magdy Abadir      Tony Ambler     
page:      17 - 23
Incorporating Cost Modeling In Embedded - System Design. (Article)
Subject: Cost Modeling
Author: Anthony J Gadient      Vijay K Modisetti      James A Debardelaben     
page:      24 - 35
Analyzing Manufacturing Test Costs. (Article)
Subject: Analyzing Test Costs
Author: Craig T Pynn     
page:      36 - 40
Test Economic In The 21st Century. (Article)
Subject:
Author: Jon Turino     
page:      41 - 44
Cost-Driven Ranking Of Memory Elements For Partial Intrusion. (Article)
Subject:
Author: Magdy Abadir      Rohit Kapur     
page:      45 - 50
The Economics Of System-Level Testing. (Article)
Subject:
Author: Tony Ambler      Des Farren     
page:      51 - 58
Ic Failure Analysis: Magic, Mystery, And Science. (Article)
Subject:
Author: Christorpher L Henderson      Richard E Anderson      Jerry M Soden     
page:      59 - 69
Diagnosing Ic Failures In A Fast Environment. (Article)
Subject:
Author: Donald Staab      Eugene R Hanatek     
page:      70 - 75
Ic Failure Analysis: The Importance Of Test And Diagnostics. (Article)
Subject:
Author: David P Vallett     
page:      76 - 82
Antomated Diagnosis In Testing And Failure Analysis. (Article)
Subject:
Author: Jeff Platt      Karl Johnson     
page:      83 - 89
Shmoo Plotting: The Black Art Of Ic Testing. (Article)
Subject:
Author: Jos Van Beers      Keith Baker     
page:      90 - 97
Modeling The Unmodelabe: Algorithm Fault Diagnosis. (Article)
Subject:
Author: Robert C Aitken     
page:      98 - 103